Non-destructive Fast Edxrf Spectrometer With Si-pin Detector , High Resolution

Desk-stand Edxrf Spectrometer With Si-Pin Detector , High resolution

Quick Detail:

 

The energy dispersive X-ray fluorescence analysis (XRF) is a method for analysing materials. It can be used for the qualitative and quantitative determination of the elemental composition of a material sample . In both laboratory and industrial environments, the XRF method is now well established and can be readily utilised with modern equipmen 

 

Competitive Advantage:

• Non-destructive: The X-radiation has absolutely no lasting influence on the material; it fully retains its quality.
• Fast: The XRF method needs very simple sample preparation and short measurement times range in the seconds, rarely longer than one minute.
• Clean: No chemicals are used.
• Safe: Method without the use of environmentally hazardous chemicals, X-radiation poses no risk for operator due to the protective instrument design.
• Universally applicable: The XRF method is suitable for material analysis in a very broad range of applications.

Description:

 

EXF9500 can provide customers higher accuracy and precision.

EXF9500 delivers wide elemental coverage with an easy-to-learn software. Non-destructively analyze from sodium (Na) through uranium (U) in powders, liquids and solids.

It is designed exactly to security standards with active radiation protection, high voltage protection and X-ray tube overheating protection.

Low cost with unmatched performance-to-price ratio

 

 

Applications:

 

Fast, precise and non-destructive metal testing for jewellery retailers, jewellery manufacturers, precious metal refineries, pawn shops, government quality inspection departments, banks, laboratories and tertiary institutions.

 

 

Specifications:

 

Working Principle:	Energy Dispersive X-ray Fluorescence
Size(mm):	670*400*300
Detection limit:	100ppm Best substance effect
Precision:	±10ppm~0.1%
Expanded Uncertainty:	≤0.19%
Operating Environment:	Temperature -11~46℃ Humidity ≤70%
High Voltage:	0~50KV/0~1MA
Detector:	Si-Pin145Kev±5
Testable Elements:	Any 20 Elements from whole elements (Na~U)
Main Structure:	High-strength metal frame and industry plastic shell
N/G Weight(KG):	30 / 35

 

Gold Tester, XRF Spectrometer, XRF Analyzer, Precious Metals Tester