ICP Inductively Coupled Plasma Emission Spectrometer for mine analysis

ICP Inductively Coupled Plasma Emission Spectrometer for mine analysis Product Description   The ICP can measurate elements more than seventy that diversified from microanalysis to constant analysis. It is wide-ranging application in geologic,metallurgy, thulium, plating, cement,oil,chemical, environmental detection, coloured metal, physic sanitation, food, geoponics, scientific research, college and mine factory etc. It is not only good selling within the similar goods in our country but also have good reputation in international market.   It is the honesty that our company based on. Relying on the strong after-selling service system, our client can incisively use the instrument performance to the advantage, that can satisy the requirement of the quick and exact analysis performance of clients and avoid the trouble after selling.
  Main characteristics: 1,The Self-sustaining radio frequency generator with power controlling makes the output power steady. 2,The design of the optimization optical reducing mottle light ,the high reticle ion etch holographic grating guarantee the high resolving power. 3,Adoptation of importation step motor and low modulus big-gear transmission framework guarantee scan precision. 4,Adoptation of intelligentize data transmission system heighten the analysis speed. 5,Adoptation of the Windows operating system of good operating system make the instrument operation convinient. 6,Adoptation of two grating for interconvert satisfy demanding of different users.     Software analysis way   1,Searching zero class   Searching zero class is instrument inspect orientation basic gist. The instrument auto zero class wave length revise and Confirm the instrument orientation zero before boot-strap every time.   2,Upbuild analysis way   After startup program, first according to the classification which is ready to be measured, user maybe take it from means interface element-circling period table and then choose that element chart line and relatively operation parameter. The user upbuild a suit of better analysis means which can greatly improve work efficiency.   3,Wave chart analysis   Adopt chart line that it has added in the means to process peak-searching task, the software can automaticly search chart line peak value, if the chart map has multipal peaks the user can choose it manuualy, that can get rid of disturbing element outside chart line.   4,Standard curve   The standard curve is the base of the quantified mearurement to sample products, commonly thing, should be choice high standard content and low standard content to upbuild a standard curve, the ready element content is the basis of this curve measure the intension to figure out the element concentration .   5,Sample measure   The sample measure is the basis of standard curve equation, search ready measure element photic intensity corresponding strength value, the corresponding strength value units may be use percent content % or ppm to show.   6,Data output   The measure result data can be seen or printed out in system.   Technical parameters   Technique index Sample introduction system 1,Quartz tubes:                   F20mm three concentric type 2,Nebulizer:                            F6mm coaxial type 3,Atomization chamber:     F35mm double canister type 4,Plasma gas flow:               100-1000L/h 5,Assistant gas flow:            6-60L/h 6,Carrier gas volume:             6-60L/h 7,Carrier gas pressure:          Maximum 0.3Mpa   Radio frequency generator 1,Circuit type:                      Self oscillate circuit,coaxial-cable output, matching tune 2,Work frequency:              40MHz 3,Frequency stability:             <0.1% 4,Power output:                   800-1200W 5,Power output stability:       <0.2% 6,Power supply:                         220V 25A   Scaning spectrophotometer 1,Light way system:             Czerny Turner type 2,Focus:                              750mm,1000mm 3,Grating:                            Ion etch holographic grating, reticle density 3600line/mm&2400line/mm. reticle area (80x100)mm 4,Resolving power:             ≤0.008nm 5,Scan wavelength range:      3600line/mm scan wave length range:195 nm-500nm 2400line/mm scan wave length range:195nm-800nm 6,Scan step distance:             0.0006nm 7,Scan repeat quality:             ≤0.0006nm   Inspection system 1,The F/V switch circuit controlled by singlechip 2,Sampling time:                     100ms-10s 3,Photomultiplier Tube:          R212UH 4,PMT negative high voltage: 200-990V, stability ≤0.05%   Equipment technical index: 1,Analytic speed:                    Over 10 element per minute 2,Precision:                                Relatively standard deviation RSD≤2%(short time stability) 3,Stability:                            Relatively standard deviation RSD≤3%(one hour measure) 4,Measure line range:            ≥5 scalar class 5,Inspect lowest limit:         Typical element inspect limit reference below table   Packaging & Shipping     Our Services   Company Information   The exhibition ICP Inductively Coupled Plasma Emission Spectrometer for mine analysis