Product description
Characteristics:
- High-power of 55W
- V in: 9-16V (13.2V nominal)
- L in: 4.8A nominal (10A maximum)
- V start: 23KV maximum
- Output power: 55W ±1W
- Working temperature: -40 - 105°C
- Stability time: 40 - 50s (cool bulb)
- Efficiency: e84%
- Over-voltage, short-circuit, under-voltage and over-current protection
- Waterproof, anti-dust and shock-proof
- Full glue, natural cooling
- Size: 84 x 63 x 16mm
Advantages of Anhong HID ballast:
- Intelligent MCU inside, intelligently supply power to the bulb
- Adopting high class materials included:
- ST 75N75 chip
- RUBYCOM capacitor
- UTC MOS tube
- Regular price, 15% faster light up than regular AC ballast
- Full 35W/55W power, at least 2 years lifespan
- Intelligent digital circuits
- Never exceed 0.8% defective rate from last 4 years
- Twice aging test before packing
- Riot control, heat dissipation design
- Short light-up time
Submitted test as below:
- 10-hour continuous aging test
- Connection circuit protection test
- Over-voltage protection test
- Flashlight concussion test
- Shock-proof capability test
- Cold, warm boot test
- Polarity protection test
- Short-circuit protection test
- EMC anti-jamming test
High-power of 55W
V in: 9-16V (13.2V nominal)
L in: 4.8A nominal (10A maximum)
V start: 23KV maximum
Output power: 55W ±1W
Working temperature: -40 - 105°C
Stability time: 40 - 50s (cool bulb)
Efficiency: e84%
Over-voltage, short-circuit, under-voltage and over-current protection
Waterproof, anti-dust and shock-proof
Full glue, natural cooling
Size: 84 x 63 x 16mm
Intelligent MCU inside, intelligently supply power to the bulb
Adopting high class materials included:
- ST 75N75 chip
- RUBYCOM capacitor
- UTC MOS tube
Regular price, 15% faster light up than regular AC ballast
Full 35W/55W power, at least 2 years lifespan
Intelligent digital circuits
Never exceed 0.8% defective rate from last 4 years
Twice aging test before packing
Riot control, heat dissipation design
Short light-up time
ST 75N75 chip
RUBYCOM capacitor
UTC MOS tube
10-hour continuous aging test
Connection circuit protection test
Over-voltage protection test
Flashlight concussion test
Shock-proof capability test
Cold, warm boot test
Polarity protection test
Short-circuit protection test
EMC anti-jamming test
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