L Power Frequency Series Resonant Test System

Product Introduction

With the development of power system the capacity of running equipment is increasing. For example Thermal generator group the single capacity has exceeded 1000MW and hydrodynamo group the maximum capacity has reached 800MW. If traditional test equipment (power frequency test transformer) is used for the ac power frequency withstand Voltage test of these devices the regulator is very bulky because of the large test capacity required and the high-capacity test power supply is difficult to solve in the field so the field test is extremely inconvenient. The Power frequency withstand voltage tester host no matter from test Power supply capacity equipment weight the waveform and has advantages in such aspects as investment. The Power frequency withstand voltage tester host focuses on the potential of capacity of 250 mw and below hydrodynamo ac withstand voltage test of the design and manufacture.

 

Product Characteristics

• 1、Due to full compensation of resonant reactive power the power of power supply and equipment is less than 1/10 of the required capacity of the subject (1/q10); Small size and light weight with the same capacity large output capacity of the device and small power capacity required for configuration cheap convenient and safe operation.

• 2、Series resonance is actually a current filtering circuit so that the current passing through the subject is basically the fundamental current and the waveform distortion rate (THD) of the output voltage is very small which is superior to all existing ac voltage withstand equipment.

• 3、The short circuit current of the sample after flashover or breakdown is only less than 1/10 (1/Q) of the test current before short circuit which can effectively prevent the expansion of damage to the fault point after breakdown.

• 4、After flashover the arc will be automatically extinguished immediately. The long (number of seconds) process of restoring resonant state voltage after arc quenching is a steady-state establishment process and there is no danger of voltage overshoot and no danger of restoring overvoltage in microsecond millisecond transient process.