Product description
With the Yokogawa TDLS500 (ICOS) Analyzer, rapid, continuous measurements are possible for the first time in a process hardened analyzer. The TDLS500 is used for measuring trace levels of C2H2,
H2S , NH3, CO2, CO; which are typically sub-ppm detection limits (application dependent)
Integrated cavity output spectroscopy (ICOS) is a technique using optical absorption spectroscopy where the measured gas absorbs the laser light energy as a specific wavelength
The amount of light absorbed at the specific wavelength(s) is a function of gas concentration, sample pressure, sample temperature and optical path length
The concentration of the measured gas can be determined from Beer’s Law
The basic theory behind the operation of the ICOS is based on inputting the light from a laser into the optical cavity in an off-axis flow cell with respect to the on-axis cavity alignment formed by the two highly reflective dielectric mirrors
Unlike traditional absorption measurements, the optical path length of the ICOS method is very long because the laser light bounces back and forth between the highly reflective mirrors retracing the same path on each bounce
The effective path length of the cavity is given by the mirror reflectivity
Therefore, using highly reflective astigmatic mirrors with R >99.99% the laser beam can travel 10,000 passes, increasing a 20cm long cavity to an optical path length of 2,200 meters. This allows ICOS to have very high sensitivity and low detection limit at 5-20 seconds analysis time
Unlike traditional multi-pass cells or ring-down cells, the Off-Axis ICOS design does not require precise alignment. Also, mirror fouling can be compensated for during routine (automated) calibrations
Split architecture (separate sample and electronics enclosures), cell design and process hardened electronics ensure reliable operation in process environments
High sensitivity laser analysis:
- Rapid measurement (5-20s typical)
- Interference free
- TruePeak measurement
- Optical measurement - allows enhanced diagnostics
- Low long term cost of ownership
- Off-Axis ICOS technique reduces alignment sensitivity and particulate effects
- Superior performance over traditional multiple pass technologies
Rapid measurement (5-20s typical)
Interference free
TruePeak measurement
Optical measurement - allows enhanced diagnostics
Low long term cost of ownership
Off-Axis ICOS technique reduces alignment sensitivity and particulate effects
Superior performance over traditional multiple pass technologies
